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  • The paper deals with the problem of test frequency selection for multi-frequency parametric fault diagnosis of analog linear circuits. An appropriate set of test frequencies is determined by minimizing the conditionality of the sensitivity matrix based on the system of fault equations using a global stochastic optimization. A novel method based on the Particle Swarm Optimization, which provides more accurate results and improves the convergence rate, is described. The paper provides several practical examples of its application to test frequency selection for active RC filters. A comparison of the results obtained by the proposed method and by the Genetic Algorithm is also presented.
  • The paper deals with the problem of test frequency selection for multi-frequency parametric fault diagnosis of analog linear circuits. An appropriate set of test frequencies is determined by minimizing the conditionality of the sensitivity matrix based on the system of fault equations using a global stochastic optimization. A novel method based on the Particle Swarm Optimization, which provides more accurate results and improves the convergence rate, is described. The paper provides several practical examples of its application to test frequency selection for active RC filters. A comparison of the results obtained by the proposed method and by the Genetic Algorithm is also presented. (en)
Title
  • Test Frequency Selection using Particle Swarm Optimization
  • Test Frequency Selection using Particle Swarm Optimization (en)
skos:prefLabel
  • Test Frequency Selection using Particle Swarm Optimization
  • Test Frequency Selection using Particle Swarm Optimization (en)
skos:notation
  • RIV/00216305:26220/13:PU105795!RIV15-MSM-26220___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(ED2.1.00/03.0072), P(FR-TI3/431), S
http://linked.open...iv/cisloPeriodika
  • 5
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 110569
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/13:PU105795
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • fault diagnosis, frequency set selection, GA, PSO, test index measure. (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • SK - Slovenská republika
http://linked.open...ontrolniKodProRIV
  • [D846E0F5BC64]
http://linked.open...i/riv/nazevZdroje
  • Advances in Electrical and Electronic Engineering
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 11
http://linked.open...iv/tvurceVysledku
  • Kolka, Zdeněk
  • Kincl, Zdeněk
issn
  • 1336-1376
number of pages
http://localhost/t...ganizacniJednotka
  • 26220
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