About: Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells Goto Sponge Distinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Monocrystalline silicon is still very interesting material for solar cells fabrication due to its quality and external efficiency. Nevertheless during a tailoring of eligible silicon wafers, some inhomogeneities or irregularities emerge and provide defects which give trouble to good operation of solar panels. Generally, there are two classes of defects in silicon wafer-Material defects due to imperfections or irregularity in crystal structure (point, line, square or volume defects), and defects induced by wafer processing. To avoid a use of damaged cells, macroscopic and microscopic measurement techniques must be applied. In this paper we present a microscopic method combining electrical noise measurements with scanning probe localization of luminous micro-spots defects. The paper brings experimental results showing local electric and optical investigations of defects in etched monocrystalline silicon solar cells and a use of cold field emission tungsten electrode as a local probe for apertureless sc Monocrystalline silicon is still very interesting material for solar cells fabrication due to its quality and external efficiency. Nevertheless during a tailoring of eligible silicon wafers, some inhomogeneities or irregularities emerge and provide defects which give trouble to good operation of solar panels. Generally, there are two classes of defects in silicon wafer-Material defects due to imperfections or irregularity in crystal structure (point, line, square or volume defects), and defects induced by wafer processing. To avoid a use of damaged cells, macroscopic and microscopic measurement techniques must be applied. In this paper we present a microscopic method combining electrical noise measurements with scanning probe localization of luminous micro-spots defects. The paper brings experimental results showing local electric and optical investigations of defects in etched monocrystalline silicon solar cells and a use of cold field emission tungsten electrode as a local probe for apertureless sc (en)
Title	Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells (en)
skos:prefLabel	Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells (en)
skos:notation	RIV/00216305:26220/13:PU103073!RIV14-GA0-26220___
http://linked.open...avai/predkladatel	Fakulta elektrotechniky a komunikačních technologií
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(ED1.1.00/02.0068), P(ED2.1.00/03.0072), P(GAP102/11/0995)
http://linked.open...iv/cisloPeriodika	2
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Škarvada, Pavel Tománek, Pavel Grmela, Lubomír Macků, Robert Dallaeva, Dinara
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	65897
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/13:PU103073
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Silicon solar cell, Defect, Near-field optically induced photocurrent, Scanning near-field optical microscopy, Cold-field emission electrode (en)
http://linked.open.../riv/klicoveSlovo	Silicon solar cell Defect Cold-field emission electrode Near-field optically induced photocurrent Scanning near-field optical microscopy
http://linked.open...odStatuVydavatele	CN - Čínská lidová republika
http://linked.open...ontrolniKodProRIV	[FE211F572C00]
http://linked.open...i/riv/nazevZdroje	WORLD JOURNAL OF ENGINEERING
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...vavai/riv/projekt	Central european institute of technology Centre of sensor, information and communication systems Electron transport, Noise and Diagnostic of Shottky and Autoemission Cathodes
http://linked.open...UplatneniVysledku	2013
http://linked.open...v/svazekPeriodika	10
http://linked.open...iv/tvurceVysledku	Grmela, Lubomír Macků, Robert Tománek, Pavel Škarvada, Pavel Dallaeva, Dinara Smith, Steve J.
issn	1708-5284
number of pages	6 (xsd:int)
http://localhost/t...ganizacniJednotka	26220

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 77 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software