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  • The X-ray microanalysis performed in ESEM requires to take into account presence of gas in the specimen chamber. The impact of electron scattering causes disadvantageous general increase of concentration limits of executed analysis by additional X-ray peaks contributed by the so called skirt. At X-ray analysis scattered skirt electrons interact with atoms of specimen and produce X-rays but we do not know which X-rays are produced by primary beam and which are produced by skirt electrons. Pressure variation method is described. This method enables extrapolation of X- ray spectral measurements at higher pressures to zero pressure.
  • The X-ray microanalysis performed in ESEM requires to take into account presence of gas in the specimen chamber. The impact of electron scattering causes disadvantageous general increase of concentration limits of executed analysis by additional X-ray peaks contributed by the so called skirt. At X-ray analysis scattered skirt electrons interact with atoms of specimen and produce X-rays but we do not know which X-rays are produced by primary beam and which are produced by skirt electrons. Pressure variation method is described. This method enables extrapolation of X- ray spectral measurements at higher pressures to zero pressure. (en)
  • Pro rtg mikroanalýzu v ESEM je potřebné vzít v úvahu přítomnost plynu v komoře vzorku. Dopad elektronů rozptýlených do tzv. sukénky způsobuje nevýhodné zvýšení prováděných analýz a vznik dalších rtg píků. Při rtg analýze interagují elektrony rozptýlené do sukénky s atomy vzorku a vytvářejí rtg záření, ale není známo které záření vzniká vlivem primárního svazku a které vlivem elektronů sukénky. Je popsána metoda nazvaná pressure variation metod. Tato metoda umožňuje extrapolaci měření rtg spekter od nejvyšších tlaků do nulového tlaku. (cs)
Title
  • X - RAY MICROANALYSIS IN ESEM
  • Rentgenová mikroanalýza v ESEM (cs)
  • X - RAY MICROANALYSIS IN ESEM (en)
skos:prefLabel
  • X - RAY MICROANALYSIS IN ESEM
  • Rentgenová mikroanalýza v ESEM (cs)
  • X - RAY MICROANALYSIS IN ESEM (en)
skos:notation
  • RIV/00216305:26220/06:PU64539!RIV07-MSM-26220___
http://linked.open.../vavai/riv/strany
  • 153-156
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM0021630516)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 509145
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/06:PU64539
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • ESEM, X-ray, microanalysis (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [67E6260F3C95]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Brno
http://linked.open...i/riv/nazevZdroje
  • 7th Aba BRNO 2006
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Jirák, Josef
  • Špinka, Jiří
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav elektrotechnologie
https://schema.org/isbn
  • 80-214-3181-4
http://localhost/t...ganizacniJednotka
  • 26220
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