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| rdf:type
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| Description
| - The noise spectroscopy and third harmonic measurements were used to investigate effect of the contact electrode material on the thick film resistor quality and reliability. Strong dependence of non-linearity both on the type of the resistor paste and contract electrode material was observed. Dependence of noise quality indicator on the type of resistor paste is important, the influence of contact electrode material was studied using standard statistical evaluation. Thick film resistors with AgPd contactt electrode have higher value of third harmonic voltage, but show better long term stability and reliability comparing with resistors with Ag contact electrode. From the SEM figures we determined, that the sharpness of AgPd contact electrode is approximately half of Ag contact electrode. It was proved experimentally that noise spectral density is proportional to electric field intensity, while third harmonic voltage depends on the third power of electric field intensity or current density. Modelling of (cs)
- The noise spectroscopy and third harmonic measurements were used to investigate effect of the contact electrode material on the thick film resistor quality and reliability. Strong dependence of non-linearity both on the type of the resistor paste and contract electrode material was observed. Dependence of noise quality indicator on the type of resistor paste is important, the influence of contact electrode material was studied using standard statistical evaluation. Thick film resistors with AgPd contacct electrode have higher value of third harmonic voltage, but show better long term stability and reliability comparing with resistors with Ag contact electrode. From the SEM figures we determined, that the sharpness of AgPd contact electrode is approximately half of Ag contact electrode. It was proved experimentally that noise spectral density is proportional to electric field intensity, while third harmonic voltage depends on the third power of electric field intensity or current density. Modelling of
- The noise spectroscopy and third harmonic measurements were used to investigate effect of the contact electrode material on the thick film resistor quality and reliability. Strong dependence of non-linearity both on the type of the resistor paste and contract electrode material was observed. Dependence of noise quality indicator on the type of resistor paste is important, the influence of contact electrode material was studied using standard statistical evaluation. Thick film resistors with AgPd contacct electrode have higher value of third harmonic voltage, but show better long term stability and reliability comparing with resistors with Ag contact electrode. From the SEM figures we determined, that the sharpness of AgPd contact electrode is approximately half of Ag contact electrode. It was proved experimentally that noise spectral density is proportional to electric field intensity, while third harmonic voltage depends on the third power of electric field intensity or current density. Modelling of (en)
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| Title
| - Rozdělení proudové hustoty, šum a nelinearita tlustovrstvových odporů (cs)
- Current density distribution, noise and non-linearity of thick film resistors
- Current density distribution, noise and non-linearity of thick film resistors (en)
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| skos:prefLabel
| - Rozdělení proudové hustoty, šum a nelinearita tlustovrstvových odporů (cs)
- Current density distribution, noise and non-linearity of thick film resistors
- Current density distribution, noise and non-linearity of thick film resistors (en)
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| skos:notation
| - RIV/00216305:26220/03:PU39160!RIV06-MSM-26220___
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| http://linked.open.../vavai/riv/strany
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| http://linked.open...avai/riv/aktivita
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| http://linked.open...avai/riv/aktivity
| - P(ME 605), Z(MSM 262200022)
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| http://linked.open...vai/riv/dodaniDat
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| http://linked.open...aciTvurceVysledku
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| http://linked.open.../riv/druhVysledku
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| http://linked.open...iv/duvernostUdaju
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| http://linked.open...titaPredkladatele
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| http://linked.open...dnocenehoVysledku
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| http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/03:PU39160
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| http://linked.open...riv/jazykVysledku
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| http://linked.open.../riv/klicovaSlova
| - Noise, Non-linearity, Thick film (en)
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| http://linked.open.../riv/klicoveSlovo
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| http://linked.open...ontrolniKodProRIV
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| http://linked.open...v/mistoKonaniAkce
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| http://linked.open...i/riv/mistoVydani
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| http://linked.open...i/riv/nazevZdroje
| - Proceedings of 14th European Microelectronics and Packaging Conference
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| http://linked.open...in/vavai/riv/obor
| |
| http://linked.open...ichTvurcuVysledku
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| http://linked.open...cetTvurcuVysledku
| |
| http://linked.open...vavai/riv/projekt
| |
| http://linked.open...UplatneniVysledku
| |
| http://linked.open...iv/tvurceVysledku
| - Sedláková, Vlasta
- Tacano, Munecazu
- Šikula, Josef
- Dobis, Pavel
- Belavič, Darko
- Melkes, František
- Ročak, Dubravka
- Hashiguchi, Sumihisa
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| http://linked.open...vavai/riv/typAkce
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| http://linked.open.../riv/zahajeniAkce
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| http://linked.open...n/vavai/riv/zamer
| |
| number of pages
| |
| http://purl.org/ne...btex#hasPublisher
| |
| http://localhost/t...ganizacniJednotka
| |
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