Self-healing processes in tantalum capacitors are investigated and their influence on the value of leakage current and noise parameters evaluated. The kinetic of this regenerative dielectric breakdown is discussed for samples with MnO2 and conducting polymer cathodes.
Self-healing processes in tantalum capacitors are investigated and their influence on the value of leakage current and noise parameters evaluated. The kinetic of this regenerative dielectric breakdown is discussed for samples with MnO2 and conducting polymer cathodes. (en)