About: Multifractal analysis of drop-casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This paper applies multifractal spectrum theory to characterize the structural complexity of 3D surface roughness of copper (II) tetrasulfophthalocyanine (CuTsPc) films on the indium tin oxide (ITO) substrate, obtained with atomic force microscopy (AFM) analysis. CuTsPc films were prepared by drop cast method on ITO substrate. CuTsPc films surface roughness was studied by AFM in tapping-mode, in air, on square areas of 2500 mu m(2). A novel approach, on the basis of computational algorithms for analysis of 3D roughness surface applied for AFM data, was presented. Results revealed that the 3D surface roughness of CuTsPc films prepared by drop cast method on ITO substrate can be described using the multifractal geometry. The generalized dimensions D-q and the multifractal spectrum f() provided quantitative values that characterize the local scale properties of CuTsPc films surface geometry at nanometer scale. Data provide valuable information to describe the spatial arrangement of 3D surface roughness of CuTsPc films on ITO substrate, which was not taken into account by classical surface statistical parameters. This paper applies multifractal spectrum theory to characterize the structural complexity of 3D surface roughness of copper (II) tetrasulfophthalocyanine (CuTsPc) films on the indium tin oxide (ITO) substrate, obtained with atomic force microscopy (AFM) analysis. CuTsPc films were prepared by drop cast method on ITO substrate. CuTsPc films surface roughness was studied by AFM in tapping-mode, in air, on square areas of 2500 mu m(2). A novel approach, on the basis of computational algorithms for analysis of 3D roughness surface applied for AFM data, was presented. Results revealed that the 3D surface roughness of CuTsPc films prepared by drop cast method on ITO substrate can be described using the multifractal geometry. The generalized dimensions D-q and the multifractal spectrum f() provided quantitative values that characterize the local scale properties of CuTsPc films surface geometry at nanometer scale. Data provide valuable information to describe the spatial arrangement of 3D surface roughness of CuTsPc films on ITO substrate, which was not taken into account by classical surface statistical parameters. (en)
Title	Multifractal analysis of drop-casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates Multifractal analysis of drop-casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates (en)
skos:prefLabel	Multifractal analysis of drop-casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates Multifractal analysis of drop-casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates (en)
skos:notation	RIV/00216275:25310/14:39898649!RIV15-TA0-25310___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(EE2.3.30.0021), P(TE01020022)
http://linked.open...iv/cisloPeriodika	6
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Wágner, Tomáš Pathak, Dinesh
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Univerzita Pardubice / Fakulta chemicko-technologická
http://linked.open...dnocenehoVysledku	30982
http://linked.open...ai/riv/idVysledku	RIV/00216275:25310/14:39898649
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	surface roughness; multifractal analysis; atomic force microscopy; indium tin oxide substrate; copper (II) tetrasulfophthalocyanine films; organic semiconductors (en)
http://linked.open.../riv/klicoveSlovo	copper (II) tetrasulfophthalocyanine films indium tin oxide substrate surface roughness multifractal analysis atomic force microscopy organic semiconductors
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[BD9AA100FF84]
http://linked.open...i/riv/nazevZdroje	Surface and Interface Analysis
http://linked.open...in/vavai/riv/obor	CA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Strenthening of Research and Development Teams at the University of Pardubice Flexible printed microelectronics based on organic or hybrid materials, FLEXPRINT
http://linked.open...UplatneniVysledku	2014
http://linked.open...v/svazekPeriodika	46
http://linked.open...iv/tvurceVysledku	Wágner, Tomáš Stach, Sebastian Talu, Stefan Pathak, Dinesh Bedi, Ratish Kumar Kumar, Anshul Mahajan, Aman
http://linked.open...ain/vavai/riv/wos	000335451600005
issn	0142-2421
number of pages	6 (xsd:int)
http://bibframe.org/vocab/doi	10.1002/sia.5492
http://localhost/t...ganizacniJednotka	25310

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