About: Critical role of the sample preparation in experiments using piezoelectric actuators inducing uniaxial or biaxial strains

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About: Critical role of the sample preparation in experiments using piezoelectric actuators inducing uniaxial or biaxial strains Goto Sponge Distinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://dx.doi.org/10.1063/1.4823520
Description	We report on a systematic study of the stress transferred from an electromechanical piezo-stack into GaAs wafers under a wide variety of experimental conditions. We show that the strains in the semiconductor lattice, which were monitored in situ by means of X-ray diffraction, are strongly dependent on both the wafer thickness and on the selection of the glue which is used to bond the wafer to the piezoelectric actuator. We have identified an optimal set of parameters that reproducibly transfers the largest distortions at room temperature. We have studied strains produced not only by the frequently used uniaxial piezostressors but also by the biaxial ones which replicate the routinely performed experiments using substrate-induced strains but with the advantage of a continuously tunable lattice distortion. The time evolution of the strain response and the sample tilting and/or bending are also analyzed and discussed. (C) 2013 AIP Publishing LLC. We report on a systematic study of the stress transferred from an electromechanical piezo-stack into GaAs wafers under a wide variety of experimental conditions. We show that the strains in the semiconductor lattice, which were monitored in situ by means of X-ray diffraction, are strongly dependent on both the wafer thickness and on the selection of the glue which is used to bond the wafer to the piezoelectric actuator. We have identified an optimal set of parameters that reproducibly transfers the largest distortions at room temperature. We have studied strains produced not only by the frequently used uniaxial piezostressors but also by the biaxial ones which replicate the routinely performed experiments using substrate-induced strains but with the advantage of a continuously tunable lattice distortion. The time evolution of the strain response and the sample tilting and/or bending are also analyzed and discussed. (C) 2013 AIP Publishing LLC. (en)
Title	Critical role of the sample preparation in experiments using piezoelectric actuators inducing uniaxial or biaxial strains Critical role of the sample preparation in experiments using piezoelectric actuators inducing uniaxial or biaxial strains (en)
skos:prefLabel	Critical role of the sample preparation in experiments using piezoelectric actuators inducing uniaxial or biaxial strains Critical role of the sample preparation in experiments using piezoelectric actuators inducing uniaxial or biaxial strains (en)
skos:notation	RIV/00216208:11320/13:10173372!RIV14-GA0-11320___
http://linked.open...avai/predkladatel	Matematicko-fyzikální fakulta
http://linked.open...avai/riv/aktivita	P S
http://linked.open...avai/riv/aktivity	P(GAP204/12/0853), P(GPP204/11/P339), S
http://linked.open...iv/cisloPeriodika	10
http://linked.open...vai/riv/dodaniDat	2014
http://linked.open...aciTvurceVysledku	Holý, Václav Schmoranzerová, Eva Saidl, Vít Butkovičová, Dagmar Němec, Petr Martí, Xavier
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Univerzita Karlova v Praze / Matematicko-fyzikální fakulta
http://linked.open...dnocenehoVysledku	67322
http://linked.open...ai/riv/idVysledku	RIV/00216208:11320/13:10173372
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	semiconductors (en)
http://linked.open.../riv/klicoveSlovo	semiconductors
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[C497B98EE894]
http://linked.open...i/riv/nazevZdroje	Review of Scientific Instruments
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	6 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Ultrafast optical manipulation of magnetic order in semiconductors Room temperature electric field control of exchange bias in antiferromagnetic semiconductors
http://linked.open...UplatneniVysledku	2013
http://linked.open...v/svazekPeriodika	84
http://linked.open...iv/tvurceVysledku	Martí, Xavier Němec, Petr Holý, Václav Wadley, P. Butkovičová, Dagmar Saidl, Vít Schmoranzerová, Eva
http://linked.open...ain/vavai/riv/wos	000326645300033
issn	0034-6748
number of pages	5 (xsd:int)
http://bibframe.org/vocab/doi	10.1063/1.4823520
http://localhost/t...ganizacniJednotka	11320

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