About: Microstructural characterization of nanocrystalline powders and thin films by X-ray powder diffraction

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The most pronounced diffraction effect connected with nanocrystalline materials is huge broadening of diffraction peaks. Then the classical evaluation of XRD pattern based on the analysis of individual peaks becomes complicated because of severe peak overlapping and must be replaced by the so-called total pattern fitting or modelling. A new software MStruct has been developed for the purpose and applied here for different samples of titanium dioxide. The model considers instrumental aberrations corresponding to the applied diffraction geometries (e.g. absorption, refraction) and mainly physical models of real microstructure such as crystallite size and distribution, dislocation densities and correlation, phenomenological microstrain, stacking faults, residual stress and preferred grain orientation. Corresponding parameters can be refined by optimisation algorithm. The most pronounced diffraction effect connected with nanocrystalline materials is huge broadening of diffraction peaks. Then the classical evaluation of XRD pattern based on the analysis of individual peaks becomes complicated because of severe peak overlapping and must be replaced by the so-called total pattern fitting or modelling. A new software MStruct has been developed for the purpose and applied here for different samples of titanium dioxide. The model considers instrumental aberrations corresponding to the applied diffraction geometries (e.g. absorption, refraction) and mainly physical models of real microstructure such as crystallite size and distribution, dislocation densities and correlation, phenomenological microstrain, stacking faults, residual stress and preferred grain orientation. Corresponding parameters can be refined by optimisation algorithm. (en)
Title	Microstructural characterization of nanocrystalline powders and thin films by X-ray powder diffraction Microstructural characterization of nanocrystalline powders and thin films by X-ray powder diffraction (en)
skos:prefLabel	Microstructural characterization of nanocrystalline powders and thin films by X-ray powder diffraction Microstructural characterization of nanocrystalline powders and thin films by X-ray powder diffraction (en)
skos:notation	RIV/00216208:11320/09:00206429!RIV10-MSM-11320___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(KAN400720701), Z(MSM0021620834)
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Matěj, Zdeněk Kužel, Radomír Nichtová, Lea
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Univerzita Karlova v Praze / Matematicko-fyzikální fakulta
http://linked.open...dnocenehoVysledku	326226
http://linked.open...ai/riv/idVysledku	RIV/00216208:11320/09:00206429
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Microstructural; characterization; nanocrystalline; powders; films; X-ray; powder; diffraction (en)
http://linked.open.../riv/klicoveSlovo	powder characterization films nanocrystalline powders X-ray diffraction Microstructural
http://linked.open...ontrolniKodProRIV	[2A6B1B386B5C]
http://linked.open...v/mistoKonaniAkce	Ostrava
http://linked.open...i/riv/mistoVydani	Ostrava
http://linked.open...i/riv/nazevZdroje	Nanocon 2009
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Hierarchic nanosystems for microelektronics
http://linked.open...UplatneniVysledku	2009
http://linked.open...iv/tvurceVysledku	Matěj, Zdeněk Kužel, Radomír Nichtová, Lea
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2009-01-01 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Condensed Matter Physics – New Materials and Technologies
number of pages	10 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Tanger s.r.o.
https://schema.org/isbn	978-80-87294-12-3
http://localhost/t...ganizacniJednotka	11320
is http://linked.open...avai/riv/vysledek of	Microstructural characterization of nanocrystalline powders and thin films by X-ray powder diffraction Microstructural characterization of nanocrystalline powders and thin films by X-ray powder diffraction Microstructural characterization of nanocrystalline powders and thin films by X-ray powder diffraction Microstructural characterization of nanocrystalline powders and thin films by X-ray powder diffraction

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