Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles
Mikroskopie atomárních sil (AFM), transmisní elektronová mikroskopie (TEM) a rastrovací elektronová mikroskopie (SEM) destičkovitých nanočástic jiné fáze (cs)
Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles (en)
Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles
Mikroskopie atomárních sil (AFM), transmisní elektronová mikroskopie (TEM) a rastrovací elektronová mikroskopie (SEM) destičkovitých nanočástic jiné fáze (cs)
Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles (en)
Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles
Mikroskopie atomárních sil (AFM), transmisní elektronová mikroskopie (TEM) a rastrovací elektronová mikroskopie (SEM) destičkovitých nanočástic jiné fáze (cs)
Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles (en)