About: Novel electronic devices based on control of strain at the nanoscale     Goto   Sponge   Distinct   Permalink

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Description
  • Aims: This JRP will develop traceable measurement and characterisation of strain at the nanoscale in piezoelectric materials. Significant advances will be made in developing non-destructive measurement techniques suitable for the characterisation of novel electronic devices, and the effects of sample preparation for destructive techniques such as transmission electron microscopy (TEM) will be investigated.
  • Aims: This JRP will develop traceable measurement and characterisation of strain at the nanoscale in piezoelectric materials. Significant advances will be made in developing non-destructive measurement techniques suitable for the characterisation of novel electronic devices, and the effects of sample preparation for destructive techniques such as transmission electron microscopy (TEM) will be investigated. (en)
Title
  • Novel electronic devices based on control of strain at the nanoscale
  • Novel electronic devices based on control of strain at the nanoscale (en)
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  • 7AX13018
http://linked.open...avai/cep/aktivita
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  • electronic devices; nanoscale (en)
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  • electronic devices
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