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Description
| - We present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the beam spot area we apply and refine the definition of so called effective area (A(eff)) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which is inappropriate for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft X-ray free-electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination are presented in this work. An F-scan method, newly developed in this paper, appears to be a good candidate for the spatial beam diagnostics applicable to lasers of various kinds.
- We present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the beam spot area we apply and refine the definition of so called effective area (A(eff)) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which is inappropriate for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft X-ray free-electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination are presented in this work. An F-scan method, newly developed in this paper, appears to be a good candidate for the spatial beam diagnostics applicable to lasers of various kinds. (en)
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Title
| - Spot size characterization of focused non-Gaussian X-ray laser beams
- Spot size characterization of focused non-Gaussian X-ray laser beams (en)
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skos:prefLabel
| - Spot size characterization of focused non-Gaussian X-ray laser beams
- Spot size characterization of focused non-Gaussian X-ray laser beams (en)
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skos:notation
| - RIV/68378271:_____/10:00359300!RIV12-AV0-68378271
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GAP208/10/2302), P(IAAX00100903), P(KAN300100702), P(LA08024), P(LC510), P(LC528), P(ME10046), Z(AV0Z10100523)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68378271:_____/10:00359300
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - X-ray laser; free-electron laser; beam characterization; ablation (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - US - Spojené státy americké
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Burian, Tomáš
- Chalupský, Jaromír
- Hájková, Věra
- Juha, Libor
- Krzywinski, J.
- Vyšín, Luděk
- Cihelka, Jaroslav
- Gaudin, J.
- Gleeson, A.
- Jurek, M.
- Khorsand, A. R.
- Klinger, D.
- Sobierajski, R.
- Störmer, M.
- Tiedtke, K.
- Toleikis, S.
- Wabnitz, H.
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http://linked.open...ain/vavai/riv/wos
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http://linked.open...n/vavai/riv/zamer
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issn
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number of pages
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http://bibframe.org/vocab/doi
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