About: Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM

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About: Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM Goto Sponge Distinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The grain boundary triple junction has been extracted from the tri-crystal and examined in high-resolution aberration-corrected FEG-STEM instruments. An in situ focused ion beam lift-out technique has been combined with an additional precision ion-polishing stage to reproducibly provide thin-foil specimens suitable for high-resolution EELS and EDX analysis. The grain boundary triple junction has been extracted from the tri-crystal and examined in high-resolution aberration-corrected FEG-STEM instruments. An in situ focused ion beam lift-out technique has been combined with an additional precision ion-polishing stage to reproducibly provide thin-foil specimens suitable for high-resolution EELS and EDX analysis. (en) Trojný styk hranic zrn byl vypreparován z trikrystalu a vyšetřován ve vysokorozlišovacím FEG-STEM zařízení vybaveném korekcí na aberaci. Technika in situ odprašování fokusovaným iontovým svazkem v kombinaci s následným dokonalým leštěním poskytla vzorky ve tvaru tenkých folií vhodné EELS a EDX analýzu s vysokým rozlišením. (cs)
Title	Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM (en) Příprava lokalizovaných tenkých folií z bi- a trikrystalů Fe-3%Si pro FEG-STEM vyšetřování (cs)
skos:prefLabel	Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM (en) Příprava lokalizovaných tenkých folií z bi- a trikrystalů Fe-3%Si pro FEG-STEM vyšetřování (cs)
skos:notation	RIV/68378271:_____/09:00322208!RIV09-AV0-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(IAA1010414), Z(AV0Z10100520)
http://linked.open...iv/cisloPeriodika	2
http://linked.open...vai/riv/dodaniDat	2009
http://linked.open...aciTvurceVysledku	Lejček, Pavel
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	335732
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/09:00322208
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	FEG-STEM; Fe-3%Si; Thin foils; focused ion beam (en)
http://linked.open.../riv/klicoveSlovo	Fe-3%Si focused ion beam FEG-STEM Thin foils
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[B01AE3018DFC]
http://linked.open...i/riv/nazevZdroje	Ultramicroscopy
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Crystallization of single- and multiphase materials
http://linked.open...UplatneniVysledku	2009
http://linked.open...v/svazekPeriodika	109
http://linked.open...iv/tvurceVysledku	Lejček, Pavel Flewitt, P.E.J. Heard, P. J. Hughes, G. M. Sorbello, F.
http://linked.open...ain/vavai/riv/wos	000263217000002
http://linked.open...n/vavai/riv/zamer	Specific effects in condensed systems with reduced dimension and broken symmetry
issn	0304-3991
number of pages	7 (xsd:int)

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