About: Imaging of specimens at optimized low and very low energies in scanning electron microscopy.

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About: Imaging of specimens at optimized low and very low energies in scanning electron microscopy. Goto Sponge Distinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	A modern trend toward low electron energies in scanning electron microscopy (SEM), characterised by lowering the acceleration voltages in low voltage SEM (LVSEM) or by utilising a retarding-field optical element in low energy SEM (LESEM), makes the energy range where new contrasts appear accessible. This range is further extended by a cathode-lens equipped scanning low energy electron microscope (SLEEM) which achieves nearly constant spatial resolution throughout the energy scale. This enables one to optimise freely the electron beam energy according to the ask. At low energies, classes of image contrast exist that make visitable particular specimen data most effectively or even exclusively within certain energy intervals or at certain energy values only. Some contrasts are well understood and can already be utilised for practical surface examinations but others are not yet reliably explained and complementary experiments are needed. A modern trend toward low electron energies in scanning electron microscopy (SEM), characterised by lowering the acceleration voltages in low voltage SEM (LVSEM) or by utilising a retarding-field optical element in low energy SEM (LESEM), makes the energy range where new contrasts appear accessible. This range is further extended by a cathode-lens equipped scanning low energy electron microscope (SLEEM) which achieves nearly constant spatial resolution throughout the energy scale. This enables one to optimise freely the electron beam energy according to the ask. At low energies, classes of image contrast exist that make visitable particular specimen data most effectively or even exclusively within certain energy intervals or at certain energy values only. Some contrasts are well understood and can already be utilised for practical surface examinations but others are not yet reliably explained and complementary experiments are needed. (en)
Title	Imaging of specimens at optimized low and very low energies in scanning electron microscopy. Imaging of specimens at optimized low and very low energies in scanning electron microscopy. (en)
skos:prefLabel	Imaging of specimens at optimized low and very low energies in scanning electron microscopy. Imaging of specimens at optimized low and very low energies in scanning electron microscopy. (en)
skos:notation	RIV/68081731:_____/99:12020094!RIV/2003/AV0/A12003/N
http://linked.open.../vavai/riv/strany	7 ; 22
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA202/95/0280), P(GA202/96/0961), P(IAA2065502), Z(AV0Z2065902)
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2003
http://linked.open...aciTvurceVysledku	Müllerová, Ilona
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	742365
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/99:12020094
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	contrast mechanisms; scanning electron microscope; low electron energies (en)
http://linked.open.../riv/klicoveSlovo	scanning electron microscope contrast mechanisms low electron energies
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[72EFB1E83F3B]
http://linked.open...i/riv/nazevZdroje	Scanning Microscopy
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	1 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	Examination of a solid surface to very low energy scanned electron beam illumination under high lateral resolution Verification of the principle of zero - charging high resolution scanning electron microscopy and its applications. Further development of microscopy and diffraction by using very loš electrons in the scanning electron microscope
http://linked.open...UplatneniVysledku	1999
http://linked.open...v/svazekPeriodika	13
http://linked.open...iv/tvurceVysledku	Müllerová, Ilona
http://linked.open...n/vavai/riv/zamer	Rozvoj fyzikálních metod, speciálních technologií a přístrojových principů využívajících elektronových a světelných svazků a radiofrekvenční spektroskopie
issn	0891-7035
number of pages	16 (xsd:int)

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