About: A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs

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About: A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs Goto Sponge Distinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Scanning Low Energy Electron Microscopy (SLEEM) is an imaging technique which uses low energy electrons while providing a very good image resolution. Reflectivity of very slow electrons in the range 0–30 eV can be correlated with the electronic structure of the material, aiming at the determination of the local crystallographic orientation. Since SLEEM is a 2D imaging method, a suitable algorithm is needed to pre-process the image data depending on the beam energy as the third dimension. The crucial task is to detect grain boundaries in polycrystals and evaluate the image signal in connection to the energy of electron impact. Recent algorithms performing the task for the traditional EBSD method are not suitable as they do not address the side-effects of the SLEEM technique. We propose a method that detects the grain boundaries while correcting for image distortion caused by the variation of cathode lens strength, and for several other issues. Scanning Low Energy Electron Microscopy (SLEEM) is an imaging technique which uses low energy electrons while providing a very good image resolution. Reflectivity of very slow electrons in the range 0–30 eV can be correlated with the electronic structure of the material, aiming at the determination of the local crystallographic orientation. Since SLEEM is a 2D imaging method, a suitable algorithm is needed to pre-process the image data depending on the beam energy as the third dimension. The crucial task is to detect grain boundaries in polycrystals and evaluate the image signal in connection to the energy of electron impact. Recent algorithms performing the task for the traditional EBSD method are not suitable as they do not address the side-effects of the SLEEM technique. We propose a method that detects the grain boundaries while correcting for image distortion caused by the variation of cathode lens strength, and for several other issues. (en)
Title	A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs (en)
skos:prefLabel	A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs A method for extraction of crystallography-related information from a data cube of very-low-energy electron micrographs (en)
skos:notation	RIV/68081731:_____/15:00436864!RIV15-MSM-68081731
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(LO1212)
http://linked.open...iv/cisloPeriodika	JAN 2015
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Knápek, Alexandr Pokorná, Zuzana
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	6
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/15:00436864
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Very low energy; Scanning electron microscopy; SLEEM; Data cube; Image processing (en)
http://linked.open.../riv/klicoveSlovo	Image processing Very low energy Scanning electron microscopy SLEEM Data cube
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[3DCA8B78272D]
http://linked.open...i/riv/nazevZdroje	Ultramicroscopy
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	ALISI - Centre of advanced diagnostic methods and technologies
http://linked.open...UplatneniVysledku	2015
http://linked.open...v/svazekPeriodika	148
http://linked.open...iv/tvurceVysledku	Knápek, Alexandr Pokorná, Zuzana
http://linked.open...ain/vavai/riv/wos	000345973000007
issn	0304-3991
number of pages	5 (xsd:int)
http://bibframe.org/vocab/doi	10.1016/j.ultramic.2014.09.002

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