About: Surface refinement and electronic properties of graphene layers grown on copper substrate: An XPS, UPS and EELS study     Goto   Sponge   Distinct   Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

AttributesValues
rdf:type
Description
  • The present work focuses on the assessment of two surface treatment procedures employed under ultra high vacuum conditions in order to obtain atomically clean graphene layers without disrupting the morphology and the two dimensional character of the films. Graphene layers grown by chemical vapor deposition on polycrystalline Cu were stepwise annealed up to 750 °C or treated by mild Ar+ sputtering. The effectiveness of both methods and the changes that they induce on the surface morphology and electronic structure of the films were systematically studied by X-ray photoelectron spectroscopy, and electron energy loss spectroscopy. Ultraviolet photoelectron spectroscopy was employed for the study of the electronic properties of the as received sample and in combination with the work function measurements, indicated the hybridization of the C–π network with Cu d-orbitals. Mild Ar+ sputtering sessions were found to disrupt the sp2 network and cause amorphisation of the graphitic carbon.
  • The present work focuses on the assessment of two surface treatment procedures employed under ultra high vacuum conditions in order to obtain atomically clean graphene layers without disrupting the morphology and the two dimensional character of the films. Graphene layers grown by chemical vapor deposition on polycrystalline Cu were stepwise annealed up to 750 °C or treated by mild Ar+ sputtering. The effectiveness of both methods and the changes that they induce on the surface morphology and electronic structure of the films were systematically studied by X-ray photoelectron spectroscopy, and electron energy loss spectroscopy. Ultraviolet photoelectron spectroscopy was employed for the study of the electronic properties of the as received sample and in combination with the work function measurements, indicated the hybridization of the C–π network with Cu d-orbitals. Mild Ar+ sputtering sessions were found to disrupt the sp2 network and cause amorphisation of the graphitic carbon. (en)
Title
  • Surface refinement and electronic properties of graphene layers grown on copper substrate: An XPS, UPS and EELS study
  • Surface refinement and electronic properties of graphene layers grown on copper substrate: An XPS, UPS and EELS study (en)
skos:prefLabel
  • Surface refinement and electronic properties of graphene layers grown on copper substrate: An XPS, UPS and EELS study
  • Surface refinement and electronic properties of graphene layers grown on copper substrate: An XPS, UPS and EELS study (en)
skos:notation
  • RIV/61388955:_____/11:00362878!RIV12-AV0-61388955
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(IAA400400911), P(LC510), Z(AV0Z40400503)
http://linked.open...iv/cisloPeriodika
  • 23
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 233499
http://linked.open...ai/riv/idVysledku
  • RIV/61388955:_____/11:00362878
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • graphene; XPS; EELS (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [1160714A6729]
http://linked.open...i/riv/nazevZdroje
  • Applied Surface Science
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 257
http://linked.open...iv/tvurceVysledku
  • Kalbáč, Martin
  • Frank, Otakar
  • Galiotis, C.
  • Karakalos, S.
  • Ravani, F.
  • Siokou, A.
http://linked.open...ain/vavai/riv/wos
  • 000293883400016
http://linked.open...n/vavai/riv/zamer
issn
  • 0169-4332
number of pages
http://bibframe.org/vocab/doi
  • 10.1016/j.apsusc.2011.06.017
Faceted Search & Find service v1.16.118 as of Jun 21 2024


Alternative Linked Data Documents: ODE     Content Formats:   [cxml] [csv]     RDF   [text] [turtle] [ld+json] [rdf+json] [rdf+xml]     ODATA   [atom+xml] [odata+json]     Microdata   [microdata+json] [html]    About   
This material is Open Knowledge   W3C Semantic Web Technology [RDF Data] Valid XHTML + RDFa
OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 114 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software