About: Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Microcrystalline silicon is very important material for silicon based thin-film solar cells. It is especially convenient for tandem silicon solar cells using a-Si:H/?c-Si:H double- or triple-junction technology. Because the ?c-Si:H is a composition of amorphous and crystalline phases, its physical properties are strongly influenced by the volume content of the crystalline phase and by the hydrogen content in the films. Experimental diffraction and spectral lines are the convolution of various functions arising from the instrumental factors and specimen imperfections. The films were investigated by X-ray diffraction, Raman and FTIR spectroscopies using the line profile analysis. Real structure parameters of the films (crystalline volume content, micro-strains, grain sizes, hydrogen content and distribution) carried out from the analysis indicated good agreement between the results from UV/Vis spectrophotometry Microcrystalline silicon is very important material for silicon based thin-film solar cells. It is especially convenient for tandem silicon solar cells using a-Si:H/?c-Si:H double- or triple-junction technology. Because the ?c-Si:H is a composition of amorphous and crystalline phases, its physical properties are strongly influenced by the volume content of the crystalline phase and by the hydrogen content in the films. Experimental diffraction and spectral lines are the convolution of various functions arising from the instrumental factors and specimen imperfections. The films were investigated by X-ray diffraction, Raman and FTIR spectroscopies using the line profile analysis. Real structure parameters of the films (crystalline volume content, micro-strains, grain sizes, hydrogen content and distribution) carried out from the analysis indicated good agreement between the results from UV/Vis spectrophotometry (en)
Title	Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies (en)
skos:prefLabel	Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies (en)
skos:notation	RIV/49777513:23640/12:43917411!RIV13-MSM-23640___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(ED2.1.00/03.0088)
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Netrvalová, Marie Šutta, Pavol Calta, Pavel Prušáková, Lucie
http://linked.open.../riv/druhVysledku	O - Ostatní výsledky nezařaditelné do žádného z výše uvedených druhů výsledku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Západočeská univerzita v Plzni / Nové technologie - výzkumné centrum
http://linked.open...dnocenehoVysledku	150428
http://linked.open...ai/riv/idVysledku	RIV/49777513:23640/12:43917411
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	microstructure; a-Si:H, ?c-Si:H, optical properties (en)
http://linked.open.../riv/klicoveSlovo	microstructure optical properties ?c-Si:H a-Si:H
http://linked.open...ontrolniKodProRIV	[DEF5E6D36A9C]
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Centre of the New Technologies and Materials
http://linked.open...UplatneniVysledku	2012
http://linked.open...iv/tvurceVysledku	Netrvalová, Marie Šutta, Pavol Prušáková, Lucie Calta, Pavel Müllerová, Jarmila
http://localhost/t...ganizacniJednotka	23640

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