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Description
| - Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector. Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The SNOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developed a technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of per
- Scanning near-field optical microscopy (SNOM) has been used to measure the internal spatial modes and local properties controlling optical wave propagation in glass/silica buried waveguides. The period of the observed standing modes provides a direct measure of the effective index, which combined with the measured transverse modal shape and decay constants, determines the values of all spatial components of the wave vector. Typically, small fluctuations in the material properties of structures can prevent proper operation as well as accurate diagnostic device modeling. The SNOM local probe measurements provide a means of detailed characterization, and defects in processing and their affects on performance are readily identified. We have also developed a technique that can obtain information about the locations of remote dielectric interfaces based upon the rate of change in the phase of the standing wave as a function of wavelength. Finally, experimental results addressing the issue of per (en)
- Rastrovací optická mikroskopie v blízkém poli(SNOM) je možné použít k měření vnitřního rozložení vidů a lokálních vlastností vlnovodu. Malé fluktuace charakteristik materiálu mohou ovlivnit vlastní měření. Lokální sondové měření umožní vyhnout se tomutoproblému a experimentálně ověřit perturbace zavedené při měření pomocí sondy SNOM. (cs)
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Title
| - Lokální charakterizace struktur optických vlnovodů pomocí rastrovací optické mikroskopie v blízkém poli (cs)
- Local characterization of optical waveguide structure using Scanning near-field optical microscopy
- Local characterization of optical waveguide structure using Scanning near-field optical microscopy (en)
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skos:prefLabel
| - Lokální charakterizace struktur optických vlnovodů pomocí rastrovací optické mikroskopie v blízkém poli (cs)
- Local characterization of optical waveguide structure using Scanning near-field optical microscopy
- Local characterization of optical waveguide structure using Scanning near-field optical microscopy (en)
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skos:notation
| - RIV/00216305:26220/04:PU43648!RIV/2005/MSM/262205/N
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http://linked.open.../vavai/riv/strany
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(ME 544), P(OC 523.40), Z(MSM 262200022)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/04:PU43648
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - waveguide, optical properties, local probe measurement (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...v/mistoKonaniAkce
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http://linked.open...i/riv/mistoVydani
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http://linked.open...i/riv/nazevZdroje
| - Applied physics on condensed matter APCOM – 2004
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Grmela, Lubomír
- Tománek, Pavel
- Otevřelová, Dana
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http://linked.open...vavai/riv/typAkce
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http://linked.open.../riv/zahajeniAkce
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http://linked.open...n/vavai/riv/zamer
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number of pages
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http://purl.org/ne...btex#hasPublisher
| - Slovenská technická univerzita v Bratislave
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https://schema.org/isbn
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http://localhost/t...ganizacniJednotka
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