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  • Results of the measurement of current-voltage (I ~ U) characteristics and current noises in thin films of metal-free phthalocyanine are reported. I ~ U curves are typical of space-charge-limited currents with and exponential trap distribution in energy and some deep narrow trap levels. The noise in low-frequency region (f < 8 Hz) is of the 1/f type. A generation-recombination noise with two time constants being c.4x10^{-3}s and 5x10^{-5}s prevails in the higher frequency region at room temperature.
  • Results of the measurement of current-voltage (I ~ U) characteristics and current noises in thin films of metal-free phthalocyanine are reported. I ~ U curves are typical of space-charge-limited currents with and exponential trap distribution in energy and some deep narrow trap levels. The noise in low-frequency region (f < 8 Hz) is of the 1/f type. A generation-recombination noise with two time constants being c.4x10^{-3}s and 5x10^{-5}s prevails in the higher frequency region at room temperature. (en)
Title
  • Electrical Noise in Thin Films of Metal-free Phthalocyanine
  • Electrical Noise in Thin Films of Metal-free Phthalocyanine (en)
skos:prefLabel
  • Electrical Noise in Thin Films of Metal-free Phthalocyanine
  • Electrical Noise in Thin Films of Metal-free Phthalocyanine (en)
skos:notation
  • RIV/00216305:26220/03:PU39283!RIV/2004/MSM/262204/N
http://linked.open.../vavai/riv/strany
  • 66-70
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM 262200022)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
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  • 605601
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/03:PU39283
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • noise, thin films, nondestructive testing, current-voltage characteristics (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [370B1E5A105F]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Brno
http://linked.open...i/riv/nazevZdroje
  • Noise and Non-linearity Testing of Modern Electronic Components
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...ocetUcastnikuAkce
http://linked.open...nichUcastnikuAkce
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Nešpůrek, Stanislav
  • Šikula, Josef
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
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  • CNRL
https://schema.org/isbn
  • 80-238-9094-8
http://localhost/t...ganizacniJednotka
  • 26220
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