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rdf:type
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Description
| - Cílem výzkumu byla optimalizace depozičních podmínek pro přípravu čistých a Tm3+ nebo Er3+ dotovaných sulfidových tenkých vrstev metodami pulzní laserové depozice a rf magnetronovým naprašováním. Byla provedena studie kompozičních, morfologických a strukturních charakteristik použitím metod MEB-EDS, AFM, RBS, rentgenová difrakce a Ramanova spektroskopie. Byly studovány některé optické vlastnosti připravených chalkogenidových filmů (propustnost, index lomu, optická šířka zakázaného pásu energií, atd.) a propagační módy při vlnových délkách 633, 1304 a 1540 nm technikou %22m-lines prism-coupling%22. Výsledky ukazují slibné perspektivy studovaných materiálů umocněné pozorováním fotoluminiscence erbia a thulia v dotovaných sulfidových vrstvách. (cs)
- The aim of the present investigation was to optimize deposition conditions for the preparation of pure and Tm3+ or Er3+ doped sulphide films by pulsed laser deposition and rf magnetron sputtering system. The study of their compositional, morphological and structural characteristics was realized by MEB-EDS, atomic force, RBS, X-ray diffraction and Raman spectroscopy analyses. Some optical properties (transmittance, index of refraction, optical band gap, etc.) of prepared chalcogenide films and the propagation modes measured at 633 nm, 1304 nm and 1540 nm by means of the m-lines prism-coupling configuration were investigated. The whole results point out hopeful perspectives strengthened by the clear observation of the photo-luminescence of erbium and thulium within doped sulphide films.
- The aim of the present investigation was to optimize deposition conditions for the preparation of pure and Tm3+ or Er3+ doped sulphide films by pulsed laser deposition and rf magnetron sputtering system. The study of their compositional, morphological and structural characteristics was realized by MEB-EDS, atomic force, RBS, X-ray diffraction and Raman spectroscopy analyses. Some optical properties (transmittance, index of refraction, optical band gap, etc.) of prepared chalcogenide films and the propagation modes measured at 633 nm, 1304 nm and 1540 nm by means of the m-lines prism-coupling configuration were investigated. The whole results point out hopeful perspectives strengthened by the clear observation of the photo-luminescence of erbium and thulium within doped sulphide films. (en)
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Title
| - Fabrication and characterization of amorphous Ga-Ge-Sb-S thin films.
- Příprava a charakterizace amorfních tenkých vrstev Ga-Ge-Sb-S. (cs)
- Fabrication and characterization of amorphous Ga-Ge-Sb-S thin films. (en)
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skos:prefLabel
| - Fabrication and characterization of amorphous Ga-Ge-Sb-S thin films.
- Příprava a charakterizace amorfních tenkých vrstev Ga-Ge-Sb-S. (cs)
- Fabrication and characterization of amorphous Ga-Ge-Sb-S thin films. (en)
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skos:notation
| - RIV/00216275:25310/06:00004193!RIV08-MSM-25310___
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http://linked.open.../vavai/riv/strany
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GA203/05/0524), P(LC523), Z(MSM0021627501)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216275:25310/06:00004193
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - amorphous chalcogenides; thin films; pulsed laser deposition; sputtering (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - US - Spojené státy americké
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Proc. SPIE Int. Soc. Opt. Eng.
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Frumar, Miloslav
- Němec, Petr
- Nazabal, Virginie
- Jedelský, Jaroslav
- Bousquet, C.
- Cardinal, T.
- Vinatier, P.
- Adam, J.-I.
- Duverger, C.
- Jacquier, B.
- Jurdyc, Am.
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http://linked.open...n/vavai/riv/zamer
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issn
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number of pages
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http://localhost/t...ganizacniJednotka
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