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  • From the distribution of the scattered intensity in reciprocal space, information on the shape as well as on the strain distribution in nanostructured samples can be obtained. This is exemplified by applying this method to laterally patterned periodic Si/SiGe superlattices as well as to periodic SiGe dot arrays embedded in Si.
  • From the distribution of the scattered intensity in reciprocal space, information on the shape as well as on the strain distribution in nanostructured samples can be obtained. This is exemplified by applying this method to laterally patterned periodic Si/SiGe superlattices as well as to periodic SiGe dot arrays embedded in Si. (en)
  • Informace o tvaru a rozložení napětí v nanostrukturách může být získána z měření rozptýlené intenzity v reciprokém prostoru. Tuto metodu aplikujeme na laterálně strukturované periodické supermřížky Si/SiGe a na periodické mřížky SiGe teček v Si. (cs)
Title
  • X-ray diffraction from quantum wires and quantum dots
  • X-ray diffraction from quantum wires and quantum dots (en)
  • X-ray diffraction from quantum wires and quantum dots (cs)
skos:prefLabel
  • X-ray diffraction from quantum wires and quantum dots
  • X-ray diffraction from quantum wires and quantum dots (en)
  • X-ray diffraction from quantum wires and quantum dots (cs)
skos:notation
  • RIV/00216224:14310/99:00000037!RIV08-GA0-14310___
http://linked.open.../vavai/riv/strany
  • 215
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA202/97/0003)
http://linked.open...iv/cisloPeriodika
  • -
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 759082
http://linked.open...ai/riv/idVysledku
  • RIV/00216224:14310/99:00000037
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • quantum wires; quantum dots; SiGe; x-ray diffraction (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [79F11490E6AF]
http://linked.open...i/riv/nazevZdroje
  • Journal of Materials Science: Materials in Electronics
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • (10)1999
http://linked.open...iv/tvurceVysledku
  • Holý, Václav
  • Stangl, J.
  • Mikulík, Petr
  • Bauer, G.
  • Pietsch, U.
  • Darhuber, A. A.
  • Darowski, N.
  • Zhuang, Y.
issn
  • 0957-4522
number of pages
http://localhost/t...ganizacniJednotka
  • 14310
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