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rdf:type
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Description
| - From the distribution of the scattered intensity in reciprocal space, information on the shape as well as on the strain distribution in nanostructured samples can be obtained. This is exemplified by applying this method to laterally patterned periodic Si/SiGe superlattices as well as to periodic SiGe dot arrays embedded in Si.
- From the distribution of the scattered intensity in reciprocal space, information on the shape as well as on the strain distribution in nanostructured samples can be obtained. This is exemplified by applying this method to laterally patterned periodic Si/SiGe superlattices as well as to periodic SiGe dot arrays embedded in Si. (en)
- Informace o tvaru a rozložení napětí v nanostrukturách může být získána z měření rozptýlené intenzity v reciprokém prostoru. Tuto metodu aplikujeme na laterálně strukturované periodické supermřížky Si/SiGe a na periodické mřížky SiGe teček v Si. (cs)
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Title
| - X-ray diffraction from quantum wires and quantum dots
- X-ray diffraction from quantum wires and quantum dots (en)
- X-ray diffraction from quantum wires and quantum dots (cs)
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skos:prefLabel
| - X-ray diffraction from quantum wires and quantum dots
- X-ray diffraction from quantum wires and quantum dots (en)
- X-ray diffraction from quantum wires and quantum dots (cs)
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skos:notation
| - RIV/00216224:14310/99:00000037!RIV08-GA0-14310___
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http://linked.open.../vavai/riv/strany
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216224:14310/99:00000037
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - quantum wires; quantum dots; SiGe; x-ray diffraction (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - US - Spojené státy americké
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Journal of Materials Science: Materials in Electronics
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Holý, Václav
- Stangl, J.
- Mikulík, Petr
- Bauer, G.
- Pietsch, U.
- Darhuber, A. A.
- Darowski, N.
- Zhuang, Y.
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issn
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number of pages
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http://localhost/t...ganizacniJednotka
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