About: Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction     Goto   Sponge   Distinct   Permalink

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Description
  • The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001) and (000 (1) over bar) polar surfaces using the photoemission from the Zn 2p(3/2) and 0 1s core levels. The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (000 (1) over bar) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination. (C) 2011 Elsevier B.V. All rights reserved.
  • The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001) and (000 (1) over bar) polar surfaces using the photoemission from the Zn 2p(3/2) and 0 1s core levels. The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (000 (1) over bar) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination. (C) 2011 Elsevier B.V. All rights reserved. (en)
Title
  • Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction
  • Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction (en)
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  • Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction
  • Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction (en)
skos:notation
  • RIV/00216208:11320/11:10108221!RIV12-GA0-11320___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GD202/09/H041), S
http://linked.open...iv/cisloPeriodika
  • 13-14
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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http://linked.open...dnocenehoVysledku
  • 221060
http://linked.open...ai/riv/idVysledku
  • RIV/00216208:11320/11:10108221
http://linked.open...riv/jazykVysledku
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  • Photoelectron diffraction; Zinc oxide; Polarity; Wurtzite-type crystal (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [F4CB50B1ED72]
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  • Surface Science
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  • 605
http://linked.open...iv/tvurceVysledku
  • Kobayashi, K.
  • Kobata, M.
  • Píš, Igor
  • Ikenaga, E.
  • Sugiyama, T.
  • Ohashi, N.
  • Williams, JR
http://linked.open...ain/vavai/riv/wos
  • 000291905400035
issn
  • 0039-6028
number of pages
http://bibframe.org/vocab/doi
  • 10.1016/j.susc.2011.04.036
http://localhost/t...ganizacniJednotka
  • 11320
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