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  • The concentrations of near-midgap levels in high-resistivity CdTe were estimated based on a combined evaluation of room temperature lux-ampere characteristics and thermoelectric effect spectroscopy measurements (77-400 K). A simulation of experimental data was performed by a numerical solution of drift diffusion and Poisson equations using a model with two deep levels.
  • The concentrations of near-midgap levels in high-resistivity CdTe were estimated based on a combined evaluation of room temperature lux-ampere characteristics and thermoelectric effect spectroscopy measurements (77-400 K). A simulation of experimental data was performed by a numerical solution of drift diffusion and Poisson equations using a model with two deep levels. (en)
Title
  • Evaluation of the Concentration of Deep Levels in Semi-Insulating CdTe by Photoconductivity and TEES
  • Evaluation of the Concentration of Deep Levels in Semi-Insulating CdTe by Photoconductivity and TEES (en)
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  • Evaluation of the Concentration of Deep Levels in Semi-Insulating CdTe by Photoconductivity and TEES
  • Evaluation of the Concentration of Deep Levels in Semi-Insulating CdTe by Photoconductivity and TEES (en)
skos:notation
  • RIV/00216208:11320/09:00206329!RIV10-GA0-11320___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/06/0258), Z(MSM0021620834)
http://linked.open...iv/cisloPeriodika
  • 4
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  • 313929
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  • RIV/00216208:11320/09:00206329
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  • Evaluation; Concentration; Levels; Semi-Insulating; Photoconductivity; TEES (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [235E9ED38DB2]
http://linked.open...i/riv/nazevZdroje
  • IEEE Transactions on Nuclear Science
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  • 56
http://linked.open...iv/tvurceVysledku
  • Belas, Eduard
  • Franc, Jan
  • Grill, Roman
  • Höschl, Pavel
  • Praus, Petr
  • Kubát, Jan
  • Elhadidy, Hassan
http://linked.open...ain/vavai/riv/wos
  • 000269154800002
http://linked.open...n/vavai/riv/zamer
issn
  • 0018-9499
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  • 11320
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