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  • 1.                Proposed project will elaborate new measuring method based on electro-ultrasonic spectroscopy to be applied in passive component electronic industry for thick film resistors made by different technology as CERMET thick film resistors and polymer based thick film resistors. This method will be verified by known electrical nonlinearity testing method and resistor value change. It can be applied on tests of products for devices degradation or for deviation from the demanded material quality which is a categorical request of present industry. A model describing nonlinear interaction between elastic waves and electron transport, the phonon influence on electron mobility will be described. (en)
  • V předloženém projektu bude vypracována nová metoda testování tlustovrstvových rezistorů založená na elektro-ultrazvukové spektroskopii. Jedná se o aplikaci nedestruktivního testování při výrobě pasivních elektronických součástek a to rezistorů na bázi cermetů a polymerů s vodivými zrny. Tato metoda bude ověřena měřením indexu nelinearity a šumu. Bude vypracován teoretický model zahrnující nelineární interakci mezi mechanickým vlněním a transportem elektronů ve vodivé vrstvě. (cs)
Title
  • Nonlinear electro-ultrasonic spectroscopy of thick film resistors (en)
  • Nelineární elektro-ultrazvuková spektroskopie tlustovrstvových rezistorů (cs)
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  • Nonlinear spectroscopy; electro-ultrasonic spectroscopy; thick film resistor (en)
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